does your metrology measure up

Full Aperture Metrology: You no longer need to be satisfied with anything less.

 
Does your metrology measure up?
  • Are you measuring the full aperture on all your parts?
  • Are you really measuring what you think you are measuring?
  • Are you seeing everything on the surface?
  • Are you measuring aspheres?

SSIĀ® Metrology helps you answer all of these questions with confidence.

4 advantages of stitching

Aperture Size: increased clear aperture and/or numerical aperture,
Accuracy: automatic calibration of systematic errors,
Resolution: increased detail of edges and mid-spatial frequencies, and
Aspheric Departure: greater aspheric departure in non-null testing.
 
 

 
SSIĀ® Metrology systems provide a revolutionary technology. For the first time, it is possible to measure plano, convex, concave, and/or aspheric surfaces up to and exceeding 200 mm in diameter, without expensive investments in large-aperture systems, sophisticated transmission spheres, null lenses or CGHs.

You no longer need to be satisfied with anything less than full aperture metrology for virtually all of your optics.